Metrology and Measurement Systems is an international journal, peer-reviewed, quarterly-published, launched in 1988. The journal appears both in the paper form and in the electronic form on the platform MetaPress http://versita.com/mms. It is indexed by Journal Citation Reports/Science, Thomson Scientific Master Journal List, INSPEC, Scopus, Index Copernicus, Google Scholar, CSA Technology Research, High Tech Research Database, Solid State & Superconductivity.
Contributions are invited on all aspects of the research, development and applications of the measurement science and technology.
The list of topics covered includes: general principles of measurement, measurement of physical, chemical and biological quantities, medical measurements, sensors and transducers, measurement data acquisition, measurement signal transmission and processing, measurement systems and microsystems, internet-based and wireless-communication-based measurements, virtual and AI-based instruments, design and manufacture of instruments.
The average publication cycle is 6 months.